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» On Optimization of Test Parallelization with Constraints
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MTDT
2003
IEEE
105views Hardware» more  MTDT 2003»
14 years 27 days ago
A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...
Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu L...
IJCAI
1989
13 years 8 months ago
Domain Dependence in Parallel Constraint Satisfaction
We describe a general technique for expressing domain knowledge in constraint satisfaction problems, and using it to develop optimized parallel arc consistency algorithms for the ...
Paul R. Cooper, Michael J. Swain
CSCLP
2004
Springer
13 years 11 months ago
Constraint-Based Approaches to the Covering Test Problem
Covering arrays have been studied for their applications to drug screening and software and hardware testing. In this paper, we model the problem as a constraint program. Our propo...
Brahim Hnich, Steven David Prestwich, Evgeny Selen...
EVOW
1999
Springer
13 years 12 months ago
Test Pattern Generation Under Low Power Constraints
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Re...
GECCO
2008
Springer
131views Optimization» more  GECCO 2008»
13 years 8 months ago
Testing parallelization paradigms for MOEAs
In this paper, we report on our investigation of factors affecting the performance of various parallelization paradigms for multiobjective evolutionary algorithms. Different paral...
Sadeesha Gamhewa, Philip Hingston