60 search results - page 10 / 12 » On Reducing Circuit Malfunctions Caused by Soft Errors |
TDSC
2010
13 years 5 months ago
2010
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
VLSID
2005
IEEE
14 years 7 months ago
2005
IEEE
This paper employs general multivariate normal distribution to develop a new efficient statistical timing analysis methodology. The paper presents the theoretical framework of the...
FAST
2010
13 years 9 months ago
2010
Latent sector errors (LSEs) refer to the situation where particular sectors on a drive become inaccessible. LSEs are a critical factor in data reliability, since a single LSE can ...
MICRO
2008
IEEE
14 years 1 months ago
2008
IEEE
Shrinking transistor sizes and a trend toward low-power processors have caused increased leakage, high per-device variation and a larger number of hard and soft errors. Maintainin...
IOLTS
2003
IEEE
14 years 23 days ago
2003
IEEE
Fault tolerant design is a technique emerging in Integrated Circuits (IC’s) to deal with the increasing error susceptibility (Soft Errors, or Single Event Upsets, SEU) caused by...