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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
13 years 12 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
WAN
1998
Springer
13 years 11 months ago
The NRW Metacomputing Initiative
In this paper the Northrhine-Westphalian metacomputing initiative is described. We start by discussing various general aspects of metacomputing and explain the reasons for founding...
Uwe Schwiegelshohn, Ramin Yahyapour
ACMICEC
2007
ACM
303views ECommerce» more  ACMICEC 2007»
13 years 11 months ago
Impact of social influence in e-commerce decision making
Purchasing decisions are often strongly influenced by people who the consumer knows and trusts. Moreover, many online shoppers tend to wait for the opinions of early adopters befo...
Young Ae Kim, Jaideep Srivastava
KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 11 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
ESEC
1997
Springer
13 years 11 months ago
Cryptographic Verification of Test Coverage Claims
The market for software components is growing, driven on the "demand side" by the need for rapid deployment of highly functional products, and on the "supply side&q...
Premkumar T. Devanbu, Stuart G. Stubblebine