82 search results - page 10 / 17 » On Structural vs. Functional Testing for Delay Faults |
ETS
2011
IEEE
12 years 7 months ago
2011
IEEE
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...
VTS
2000
IEEE
14 years 2 hour ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
ISORC
2006
IEEE
14 years 1 months ago
2006
IEEE
Integrated architectures promise substantial technical and economic benefits in the development of distributed embedded real-time systems. In the context of diagnosis new diagnos...
ISESE
2006
IEEE
14 years 1 months ago
2006
IEEE
Effective testing of safety-critical real-time embedded software is difficult and expensive. Many companies are hesitant about the cost of formalized criteria-based testing and a...
DATE
1999
IEEE
13 years 12 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...