82 search results - page 14 / 17 » On Structural vs. Functional Testing for Delay Faults |
TCAD
2002
13 years 7 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
VTS
1997
IEEE
13 years 11 months ago
1997
IEEE
Despite all of the advantages that circular BIST ofsers compared to conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion, it has se...
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
MBEES
2008
13 years 9 months ago
2008
: In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we pr...
SIGMOD
2006
ACM
14 years 7 months ago
2006
ACM
Testing of database applications is crucial for ensuring high software quality as undetected faults can result in unrecoverable data corruption. The problem of database applicatio...