19 search results - page 3 / 4 » On test generation by input cube avoidance |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
Abstract-- In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any ...
ISSRE
2000
IEEE
13 years 11 months ago
2000
IEEE
The behavior of nondeterminate systems can be hard to predict, since similar inputs at different times can generate different outputs. In other words, the behavior seen during tes...
PLDI
2011
ACM
12 years 10 months ago
2011
ACM
Compilers should be correct. To improve the quality of C compilers, we created Csmith, a randomized test-case generation tool, and spent three years using it to find compiler bug...
NC
1998
13 years 8 months ago
1998
We suggest a recurrent neural network (RNN) model with a recurrent part corresponding to iterative function systems (IFS) introduced by Barnsley 1] as a fractal image compression ...
PKDD
2009
Springer
14 years 1 months ago
2009
Springer
Abstract. Partially ordered feature sets appear naturally in many classification settings with structured input instances, for example, when the data instances are graphs and a fe...