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» On test repair using symbolic execution
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ITC
2003
IEEE
168views Hardware» more  ITC 2003»
14 years 22 days ago
A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...
Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen ...
ASPLOS
2012
ACM
12 years 3 months ago
Path-exploration lifting: hi-fi tests for lo-fi emulators
Processor emulators are widely used to provide isolation and instrumentation of binary software. However they have proved difficult to implement correctly: processor specificati...
Lorenzo Martignoni, Stephen McCamant, Pongsin Poos...
KBSE
2010
IEEE
13 years 5 months ago
Test generation to expose changes in evolving programs
Software constantly undergoes changes throughout its life cycle, and thereby it evolves. As changes are introduced into a code base, we need to make sure that the effect of the ch...
Dawei Qi, Abhik Roychoudhury, Zhenkai Liang
FMCAD
1998
Springer
13 years 11 months ago
Symbolic Simulation: An ACL2 Approach
Executable formal speci cation can allow engineers to test (or simulate) the speci ed system on concrete data before the system is implemented. This is beginning to gain acceptance...
J. Strother Moore
SIGSOFT
2005
ACM
14 years 8 months ago
CUTE: a concolic unit testing engine for C
In unit testing, a program is decomposed into units which are collections of functions. A part of unit can be tested by generating inputs for a single entry function. The entry fu...
Koushik Sen, Darko Marinov, Gul Agha