Abstract. As semiconductor technology strides towards billions of transistors on a single die, problems concerned with deep sub-micron process features and design productivity call...
Josep Carmona, Jordi Cortadella, Victor Khomenko, ...
—This paper introduces an integrated modeling and analysis formalism based on colored Petri nets (CPNs) for supply chain configuration and evaluation. The structural changes of d...
Lianfeng Zhang, Xiao You, Jianxin Jiao, Petri Helo