The application of model-checking tools to complex systems involves a nontrivial step of modelling the system by a finite-state model and a translation of the desired properties i...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
stractions underlying distributed computing. We attempted to keep our preaims at an abstract and general level. In this column, we make those claims more concrete. More precisely, ...