372 search results - page 62 / 75 » On the Fault Testing for Reversible Circuits |
SEDE
2007
13 years 9 months ago
2007
— Achieving reliability in fault tolerant systems requires both avoidance and redundancy. This study focuses on avoidance as it pertains to the design of microchips. The lifecycl...
ISPASS
2010
IEEE
14 years 2 months ago
2010
IEEE
Continuous circuit miniaturization and increased process variability point to a future with diminishing returns from dynamic voltage scaling. Operation below Vcc-min has been prop...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
DAC
1995
ACM
13 years 11 months ago
1995
ACM
Retiming has been proposed as an optimizationstep forsequential circuits represented at the net-list level. Retiming moves the latches across the logic gates and in doing so chang...