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    3DIM
    1999
    IEEE
    113views Image Processing» more  3DIM 1999»
    A Low-Cost Range Finder Using a Visually Located, Structured Light Source
    13 years 12 months ago
    A Low-Cost Range Finder Using a Visually Located, Structured Light Source
    Download  homepages.inf.ed.ac.uk
    Robert B. Fisher, Anthony Ashbrook, Craig Robertso...
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    CAL
    2002
    108views Software Engineering» more  CAL 2002»
    A Low Power TLB Structure for Embedded Systems
    13 years 7 months ago
    A Low Power TLB Structure for Embedded Systems
    Download  www.cs.virginia.edu
    Jin-Hyuck Choi, Jung-Hoon Lee, Seh-Woong Jeong, Sh...
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    BIOINFORMATICS
    2008
    115views more  BIOINFORMATICS 2008»
    Inference of structure in subdivided populations at low levels of genetic differentiation - the correlated allele frequencies mo
    13 years 6 months ago
    Inference of structure in subdivided populations at low levels of genetic differentiation - the correlated allele frequencies mo
    Download  www2.imm.dtu.dk
    Gilles Guillot
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    SODA
    2004
    ACM
    124views Algorithms» more  SODA 2004»
    Family trees: an ordered dictionary with optimal congestion, locality, degree, and search time
    13 years 9 months ago
    Family trees: an ordered dictionary with optimal congestion, locality, degree, and search time
    Download  people.csail.mit.edu
    We consider the problem of storing an ordered dictionary data structure over a distributed set of nodes. In contrast to traditional sequential data structures, distributed data st...
    Kevin C. Zatloukal, Nicholas J. A. Harvey
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    ATS
    2005
    IEEE
    144views Hardware» more  ATS 2005»
    On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing
    14 years 1 months ago
    On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing
    Download  ira.informatik.uni-freiburg.de
    —Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
    Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Bec...
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