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CLUSTER
2003
IEEE
14 years 1 months ago
2003
IEEE
— Large Clusters, high availability clusters and Grid deployments often suffer from network, node or operating system faults and thus require the use of fault tolerant programmin...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
DAWAK
2006
Springer
13 years 11 months ago
2006
Springer
Comprehensive data analysis has become indispensable in a variety of environments. Standard OLAP (On-Line Analytical Processing) systems, designed for satisfying the reporting need...
NSPW
2003
ACM
14 years 29 days ago
2003
ACM
The ability to analyze and modify binaries is often very useful from a security viewpoint. Security operations one would like to perform on binaries include the ability to extract...
CASES
2006
ACM
14 years 1 months ago
2006
ACM
Microprocessor vendors have provided special-purpose instructions such as psadbw and pdist to accelerate the sumof-absolute differences (SAD) similarity measurement. The usefulne...