The advances in wireless communication and decreasing costs of mobile devices have enabled users to access desired information at any time. Coupled with positioning technologies l...
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
Exponentially rising cooling/packaging costs due to high power density call for architectural and software-level thermal management. Dynamic thermal management (DTM) techniques co...
In this paper, we present ELIAD, an efficient lithography aware detailed router to optimize silicon image after optical proximity correction (OPC) in a correct-by-construction man...
This work focuses on congestion-driven placement of standard cells into rows in the fixed-die context. We summarize the stateof-the-art after two decades of research in recursive ...
Andrew E. Caldwell, Andrew B. Kahng, Igor L. Marko...