229 search results - page 15 / 46 » On-Chip Test Generation Using Linear Subspaces |
ICDE
2011
IEEE
12 years 11 months ago
2011
IEEE
—Complex SQL queries are widely used today, but it is rather difficult to check if a complex query has been written correctly. Formal verification based on comparing a specifi...
CODES
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper presents an Integer Linear Programming (ILP) approach to the instruction-set extension identification problem. An algorithm that iteratively generates and solves a set...
APCCAS
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper considers z-domain transfer functions whose denominator polynomial possesses the property that the coefficient of zi is greater than the coefficient of zi-1 . Such trans...
IASTEDSE
2004
13 years 9 months ago
2004
Quality management is becoming a more and more important part of the software development process. As software testing is currently understood as the core function of the quality ...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic ...