229 search results - page 17 / 46 » On-Chip Test Generation Using Linear Subspaces |
95
Voted
VMV
2001
15 years 3 months ago
2001
We present a novel approach to localization of objects in clutter images with the use of linear adaptive filters in a two-object classifier: target object versus clutter object. A...
211
Voted
CP
2009
Springer
16 years 3 months ago
2009
Springer
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
162
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ICST
2009
IEEE
15 years 5 days ago
2009
IEEE
Euclide is a new Constraint-Based Testing tool for verifying safety-critical C programs. By using a mixture of symbolic and numerical analyses (namely static single assignment for...
127
Voted
DAC
2000
ACM
16 years 3 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
176
Voted
VLSISP
2010
15 years 24 days ago
2010
Abstract In case of insufficient data samples in highdimensional classification problems, sparse scatters of samples tend to have many ‘holes’—regions that have few or no nea...