229 search results - page 17 / 46 » On-Chip Test Generation Using Linear Subspaces |
VMV
2001
13 years 9 months ago
2001
We present a novel approach to localization of objects in clutter images with the use of linear adaptive filters in a two-object classifier: target object versus clutter object. A...
CP
2009
Springer
14 years 8 months ago
2009
Springer
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
ICST
2009
IEEE
13 years 5 months ago
2009
IEEE
Euclide is a new Constraint-Based Testing tool for verifying safety-critical C programs. By using a mixture of symbolic and numerical analyses (namely static single assignment for...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
VLSISP
2010
13 years 6 months ago
2010
Abstract In case of insufficient data samples in highdimensional classification problems, sparse scatters of samples tend to have many ‘holes’—regions that have few or no nea...