229 search results - page 22 / 46 » On-Chip Test Generation Using Linear Subspaces |
CPHYSICS
2010
13 years 7 months ago
2010
We investigate fully parallel Newton-Krylov-Schwarz (NKS) algorithms for solving the large sparse nonlinear systems of equations arising from the finite element discretization of ...
CVPR
2003
IEEE
14 years 9 months ago
2003
IEEE
We propose a new approach for face recognition under arbitrary illumination conditions, which requires only one training image per subject (if there is no pose variation) and no 3...
IBPRIA
2007
Springer
14 years 1 months ago
2007
Springer
Abstract. Piecewise-linear methods accomplish the registration by dividing the images in corresponding triangular patches, which are individually mapped through affine transformati...
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
ACCV
2007
Springer
13 years 11 months ago
2007
Springer
Normalized Cuts has successfully been applied to a wide range of tasks in computer vision, it is indisputably one of the most popular segmentation algorithms in use today. A number...