229 search results - page 4 / 46 » On-Chip Test Generation Using Linear Subspaces |
KDD
2008
ACM
14 years 8 months ago
2008
ACM
Kernel methods have been applied successfully in many data mining tasks. Subspace kernel learning was recently proposed to discover an effective low-dimensional subspace of a kern...
ICCAD
1994
IEEE
13 years 11 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
ICTAI
2008
IEEE
14 years 2 months ago
2008
IEEE
This paper delves into the problem of face recognition using color as an important cue in improving the accuracy of recognition. To perform recognition of color images, we use the...
CVPR
2004
IEEE
14 years 9 months ago
2004
IEEE
We consider the problem of segmenting multiple rigid motions from point correspondences in multiple affine views. We cast this problem as a subspace clustering problem in which th...
ICCV
1999
IEEE
13 years 12 months ago
1999
IEEE
We investigate the use of linear and nonlinear principal manifolds for learning low-dimensional representations for visual recognition. Three techniques: Principal Component Analy...