229 search results - page 5 / 46 » On-Chip Test Generation Using Linear Subspaces |
INTERSPEECH
2010
13 years 2 months ago
2010
A new noise reduction method for speech signals is proposed in this paper. The method is based upon the N-mode singular value decomposition algorithm, which exploits the multiline...
ATS
2003
IEEE
14 years 28 days ago
2003
IEEE
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
TIFS
2008
13 years 7 months ago
2008
We present a theory for constructing linear subspace approximations to face-recognition algorithms and empirically demonstrate that a surprisingly diverse set of face-recognition a...
ICPR
2004
IEEE
14 years 8 months ago
2004
IEEE
In the past decade or so, subspace methods have been largely used in face recognition ? generally with quite success. Subspace approaches, however, generally assume the training d...