106 search results - page 12 / 22 » One Tokenization per Source |
ICCV
2007
IEEE
14 years 5 months ago
2007
IEEE
We present a new method for reconstructing the exterior surface of a complex transparent scene with inhomogeneous interior (e.g., multiple interfaces, reflective or painted inter...
IMSCCS
2007
IEEE
14 years 5 months ago
2007
IEEE
In radiation environments, alpha particles, cosmic rays and solar wind flux can cause a single event upset (SEU), which is one of the major sources of bit-flips in digital electro...
NCA
2007
IEEE
14 years 5 months ago
2007
IEEE
The Internet is an extremely complex system, and it is essential that we be able to make accurate measurements in order to understand its underlying behavior or to detect improper...
ICPPW
2006
IEEE
14 years 4 months ago
2006
IEEE
Embedded computing architectures can be designed to meet a variety of application specific requirements. However, optimized hardware can require compiler support to realize the po...
ISSTA
2006
ACM
14 years 4 months ago
2006
ACM
In black-box testing, one is interested in creating a suite of tests from requirements that adequately exercise the behavior of a software system without regard to the internal st...