38 search results - page 8 / 8 » Optimal reliable crosstalk-driven interconnect optimization |
ISSRE
2000
IEEE
13 years 11 months ago
2000
IEEE
Data from several projects show a significant relationship between the size of a module and its defect density. Here we address implications of this observation. Does the overall ...
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
Design for Manufacturability (DFM) is becoming increasingly important as process geometries shrink. Conventional design rule pass/fail is not adequate to quantify DFM compliance. ...
ISLPED
2010
ACM
13 years 7 months ago
2010
ACM
The unique and unpredictable nature of silicon enables the use of physical unclonable functions (PUFs) for chip identification and authentication. Since the function of PUFs depen...