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ICASSP
2008
IEEE
14 years 3 months ago
Parametric estimation of affine deformations of binary images
We consider the problem of planar object registration on binary images where the aligning transformation is restricted to the group of affine transformations. Previous approaches...
Csaba Domokos, Zoltan Kato, Joseph M. Francos
ICCAD
2007
IEEE
143views Hardware» more  ICCAD 2007»
14 years 5 months ago
TIP-OPC: a new topological invariant paradigm for pixel based optical proximity correction
—As the 193nm lithography is likely to be used for 45nm and even 32nm processes, much more stringent requirement will be posed on Optical Proximity Correction (OPC) technologies....
Peng Yu, David Z. Pan
CISS
2008
IEEE
14 years 3 months ago
Distributed detection in the presence of frequency offset and phase shift
— In this paper, we study the problem of distributed detection in the presence of unknown carrier frequency offset (CFO) and initial phase, the issue we encounter in the emerging...
Tao Wu, Qi Cheng
ICC
2007
IEEE
113views Communications» more  ICC 2007»
14 years 3 months ago
Pilot-Aided Fine Synchronization for SC-FDE Systems on Multipath Fading Channels
—With single-carrier frequency-domain equalization (SC-FDE), the carrier-frequency offset (CFO) and samplingfrequency offset (SFO) are embedded in the phase rotations of the comp...
Ping-Hung Chiang, Gordon L. Stüber, Ding-Bing...
GLVLSI
2005
IEEE
122views VLSI» more  GLVLSI 2005»
14 years 2 months ago
Thermal aware cell-based full-chip electromigration reliability analysis
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...
Syed M. Alam, Donald E. Troxel, Carl V. Thompson