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TSE
2010
155views more  TSE 2010»
13 years 2 months ago
Incremental Test Generation for Software Product Lines
Recent advances in mechanical techniques for systematic testing have increased our ability to automatically find subtle bugs, and hence to deploy more dependable software. This pap...
Engin Uzuncaova, Sarfraz Khurshid, Don S. Batory
VLSID
2002
IEEE
92views VLSI» more  VLSID 2002»
14 years 8 months ago
Electromigration Avoidance in Analog Circuits: Two Methodologies for Current-Driven Routing
Interconnect with an insufficient width may be subject to electromigration and eventually cause the failure of the circuit at any time during its lifetime. This problem has gotten...
Jens Lienig, Goeran Jerke, Thorsten Adler
EMNLP
2010
13 years 5 months ago
Top-Down Nearly-Context-Sensitive Parsing
We present a new syntactic parser that works left-to-right and top down, thus maintaining a fully-connected parse tree for a few alternative parse hypotheses. All of the commonly ...
Eugene Charniak
EMNLP
2008
13 years 9 months ago
Selecting Sentences for Answering Complex Questions
Complex questions that require inferencing and synthesizing information from multiple documents can be seen as a kind of topicoriented, informative multi-document summarization. I...
Yllias Chali, Shafiq R. Joty
WACV
2012
IEEE
12 years 3 months ago
CompactKdt: Compact signatures for accurate large scale object recognition
We present a novel algorithm, Compact Kd-Trees (CompactKdt), that achieves state-of-the-art performance in searching large scale object image collections. The algorithm uses an or...
Mohamed Aly, Mario E. Munich, Pietro Perona