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VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
ADBIS
2000
Springer
13 years 11 months ago
2000
Springer
A number of algorithms of clustering spatial data for reducing the number of disk seeks required to process spatial queries have been developed. One of the algorithms is the scheme...
EOR
2007
13 years 8 months ago
2007
Within the economic order quantity (EOQ) framework, the main purpose of this paper is to investigate the retailerÕs optimal replenishment policy under permissible delay in paymen...
PODS
2006
ACM
14 years 8 months ago
2006
ACM
Recently, there has been an increased focus on modeling uncertainty by distributions. Suppose we wish to compute a function of a stream whose elements are samples drawn independen...
IDEAS
2006
IEEE
14 years 2 months ago
2006
IEEE
Unlike numerical preferences, preferences on attribute values do not show an inherent total order, but skyline computation has to rely on partial orderings explicitly stated by th...