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SPLC
2010
13 years 5 months ago
Improving the Testing and Testability of Software Product Lines
Abstract. Software Product Line (SPL) engineering offers several advantages in the development of families of software products. There is still a need, however, for better underst...
Isis Cabral, Myra B. Cohen, Gregg Rothermel
ICCAD
1996
IEEE
121views Hardware» more  ICCAD 1996»
13 years 11 months ago
Identification of unsettable flip-flops for partial scan and faster ATPG
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs
WSC
2007
13 years 9 months ago
Indifference-zone subset selection procedures: using sample means to improve efficiency
Two-stage selection procedures have been widely studied and applied in determining the required sample size (i.e., the number of replications or batches) for selecting the best of...
E. Jack Chen
BMCBI
2004
205views more  BMCBI 2004»
13 years 7 months ago
A combinational feature selection and ensemble neural network method for classification of gene expression data
Background: Microarray experiments are becoming a powerful tool for clinical diagnosis, as they have the potential to discover gene expression patterns that are characteristic for...
Bing Liu, Qinghua Cui, Tianzi Jiang, Songde Ma
BMCBI
2010
164views more  BMCBI 2010»
13 years 4 months ago
Merged consensus clustering to assess and improve class discovery with microarray data
Background: One of the most commonly performed tasks when analysing high throughput gene expression data is to use clustering methods to classify the data into groups. There are a...
T. Ian Simpson, J. Douglas Armstrong, Andrew P. Ja...