In this paper we analyze the application of parallel and sequential evolutionary algorithms (EAs) to the automatic test data generation problem. The problem consists of automatica...
This paper presents an approach for automated test case generation using a software specification modeled in Statecharts. The steps defined in such approach involve: translation o...
Valdivino A. Santiago, Ana Silvia Martins do Amara...
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Finding a good wavelet for a particular application and type of input data is a difficult problem. Traditional methods of wavelet deus on abstract properties of the wavelet that ca...
Testing complex Computer-Based Systems is not only a demanding but a very critical task. Therefore the use of models for generating test data is an important goal. Tool support du...