1583 search results - page 193 / 317 » Parallel High-Order Integrators |
SPAA
2000
ACM
13 years 11 months ago
2000
ACM
Modern VLSI processing supports a two-dimensional surface for active devices along with multiple stacked layers of interconnect. With the advent of planarization, the number of la...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
ICDCS
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract—RFID promises to revolutionize the inventory management in large warehouses, retail stores, hospitals, transportation systems, etc. Periodically reading the IDs of the t...
ESCIENCE
2007
IEEE
13 years 9 months ago
2007
IEEE
— The environmental science and engineering communities are actively engaged in planning and developing the next generation of large-scale sensor-based observing systems. These s...
DCOSS
2008
Springer
13 years 9 months ago
2008
Springer
Abstract. Wireless sensor networks come of age and start moving out of the laboratory into the field. As the number of deployments is increasing the need for an efficient and relia...