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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
14 years 1 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
APGV
2008
ACM
193views Visualization» more  APGV 2008»
13 years 12 months ago
Probing dynamic human facial action recognition from the other side of the mean
Insights from human perception of moving faces have the potential to provide interesting insights for technical animation systems as well as in the neural encoding of facial expre...
Cristóbal Curio, Martin A. Giese, Martin Br...
ATVA
2008
Springer
144views Hardware» more  ATVA 2008»
13 years 11 months ago
Tests, Proofs and Refinements
1 : Logic in Specification and Verification (abstract) Natarajan Shankar (SRI) Session Chair : Sungdeok Cha 12 : 00 13 : 00 Lunch 13 : 00 15 : 00 2 : Boolean Modeling of Cell Biolo...
Sriram K. Rajamani
CCS
2008
ACM
13 years 11 months ago
SNAPP: stateless network-authenticated path pinning
This paper examines a new building block for next-generation networks: SNAPP, or Stateless Network-Authenticated Path Pinning. SNAPP-enabled routers securely embed their routing d...
Bryan Parno, Adrian Perrig, Dave Andersen
DIAGRAMS
2006
Springer
13 years 11 months ago
From Diagrams to Models by Analogical Transfer
Abstract. We present a method for constructing a teleological model of a drawing of a physical device through analogical transfer of the teleological model of the same device in an...
Patrick W. Yaner, Ashok K. Goel
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