149 search results - page 18 / 30 » Parametric Fault Simulation and Test Vector Generation |
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...
DAC
2010
ACM
13 years 10 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
ATS
2000
IEEE
13 years 11 months ago
2000
IEEE
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
WSC
2007
13 years 9 months ago
2007
It is well known that trivariate reduction — a method to generate two dependent random variables from three independent random variables — can be used to generate Poisson rand...
IFIP
2001
Springer
13 years 11 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...