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IV
2003
IEEE
201views Visualization» more  IV 2003»
14 years 1 months ago
Layout Metrics for Euler Diagrams
An alternative term for these diagrams is “Euler-Venn diagrams” but they are often inaccurately called “Venn diagrams”. Venn diagrams often look similar, but must contain a...
Jean Flower, Peter Rodgers, Paul Mutton
NIPS
2004
13 years 9 months ago
Object Classification from a Single Example Utilizing Class Relevance Metrics
We describe a framework for learning an object classifier from a single example. This goal is achieved by emphasizing the relevant dimensions for classification using available ex...
Michael Fink 0002
ISPD
2003
ACM
133views Hardware» more  ISPD 2003»
14 years 1 months ago
Closed form expressions for extending step delay and slew metrics to ramp inputs
: Recent years have seen significant research in finding closed form expressions for the delay of an RC circuit that improves upon the Elmore delay model. However, several of these...
Chandramouli V. Kashyap, Charles J. Alpert, Frank ...
ICDE
2012
IEEE
203views Database» more  ICDE 2012»
11 years 10 months ago
Parameter-Free Determination of Distance Thresholds for Metric Distance Constraints
—The importance of introducing distance constraints to data dependencies, such as differential dependencies (DDs) [28], has recently been recognized. The metric distance constrai...
Shaoxu Song, Lei Chen 0002, Hong Cheng
AES
2005
Springer
137views Cryptology» more  AES 2005»
13 years 8 months ago
Design of a multimedia processor based on metrics computation
Media-processing applications, such as signal processing, 2D and 3D graphics rendering, and image compression, are the dominant workloads in many embedded systems today. The real-...
Nader Ben Amor, Yannick Le Moullec, Jean-Philippe ...