Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...
This article, which lies within the data mining framework, proposes a method to build classifiers based on the evolution of rules. The method, named REC (Rule Evolution for Classif...
This paper investigates the issue of PID-controller parameter tuning for a magnetic levitation system using the nondominated sorting genetic algorithm (NSGA-II). The magnetic levi...
Procedural representations of control policies have two advantages when facing the scale-up problem in learning tasks. First they are implicit, with potential for inductive genera...
The focus of this paper is on VLIW instruction scheduling that minimizes the variation of power consumed by the processor during the execution of a target program. We use rough set...