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» Path-based fault correlations
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ESEM
2008
ACM
13 years 9 months ago
Iterative identification of fault-prone binaries using in-process metrics
Code churn, the amount of code change taking place within a software unit over time, has been correlated with fault-proneness in software systems. We investigate the use of code c...
Lucas Layman, Gunnar Kudrjavets, Nachiappan Nagapp...
NOMS
2010
IEEE
154views Communications» more  NOMS 2010»
13 years 5 months ago
Extending a knowledge-based network to support temporal event reasoning
—While the polling or request/response paradigm adopted by many network and systems management approaches form the backbone of modern monitoring and management systems, the most ...
John Keeney, Clay Stevens, Declan O'Sullivan
FDTC
2009
Springer
100views Cryptology» more  FDTC 2009»
14 years 2 months ago
Using Optical Emission Analysis for Estimating Contribution to Power Analysis
—This paper shows that optical emissions from an operating chip have a good correlation with power traces and can therefore be used to estimate the contribution of different area...
Sergei P. Skorobogatov
ISORC
2006
IEEE
14 years 1 months ago
Diagnostic Framework for Integrated Time-Triggered Architectures
Integrated architectures promise substantial technical and economic benefits in the development of distributed embedded real-time systems. In the context of diagnosis new diagnos...
Philipp Peti, Roman Obermaisser
EURODAC
1994
IEEE
145views VHDL» more  EURODAC 1994»
13 years 11 months ago
Testability analysis and improvement from VHDL behavioral specifications
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
Xinli Gu, Krzysztof Kuchcinski, Zebo Peng