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» Pattern-Constrained Test Case Generation
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KBSE
2003
IEEE
15 years 12 months ago
Automated Requirements-based Generation of Test Cases for Product Families
Clémentine Nebut, Simon Pickin, Yves Le Tra...
ASPDAC
2000
ACM
102views Hardware» more  ASPDAC 2000»
15 years 11 months ago
Causality based generation of directed test cases
Nina Saxena, Jacob A. Abraham, Avijit Saha