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» Pattern-Constrained Test Case Generation
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MEMICS
2010
14 years 9 months ago
Test-Case Generation for Embedded Binary Code Using Abstract Interpretation
interpretation example conclusion Test-Case Generation for Embedded Binary ng Abstract Interpretation Thomas Reinbacher1 , J
Thomas Reinbacher, Jörg Brauer, Martin Horaue...
ICST
2010
IEEE
15 years 5 days ago
Verified Firewall Policy Transformations for Test Case Generation
Achim D. Brucker, Lukas Brügger, Paul Kearney...
ICST
2010
IEEE
15 years 23 days ago
Generating Transition Probabilities for Automatic Model-Based Test Generation
—Markov chains with Labelled Transitions can be used to generate test cases in a model-based approach. These test cases are generated by random walks on the model according to pr...
Abderrahmane Feliachi, Hélène Le Gue...
101
Voted
ICSE
2009
IEEE-ACM
15 years 6 months ago
Experiments on the Test Case Length in Specification Based Test Case Generation
Gordon Fraser, Angelo Gargantini