We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...
Given the great amount of data that are generated of the experiments to analyze information of extracted chemical fluids of the brain of a rodent, arises the necessity to design an...
For scene classification, patch-level linear features do not always work as well as handcrafted features. In this paper, we present a new model to greatly improve the usefulness ...
Liwei Wang, Yin Li, Jiaya Jia, Jian Sun, David Wip...
Networking hardware manufacturers face the dual demands of supporting ever increasing bandwidth requirements, while also delivering new features, such as the ability to implement ...
In this paper, we propose an integrated architecture for modeling, simulation, and execution of PLC (Programmable Logic Controller) based manufacturing system. The main objective ...
Devinder Thapa, Chang Mok Park, Kwan Hee Han, Sang...