This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
Various online social networks (OSNs) have been developed rapidly on the Internet. Researchers have analyzed different properties of such OSNs, mainly focusing on the formation an...
Lei Guo, Enhua Tan, Songqing Chen, Xiaodong Zhang,...
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced s...
Piet Engelke, Ilia Polian, Michel Renovell, Bernd ...
We examine the problem of content selection in statistical novel sentence generation. Our approach models the processes performed by professional editors when incorporating materi...
We have constructed a second generation CPG chip capable of generating the necessary timing to control the leg of a walking machine. We demonstrate improvements over a previous ch...
Francesco Tenore, Ralph Etienne-Cummings, M. Antho...