Automatic Test Pattern Generation for Resistive Bridging Faults

An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced so far, it can handle arbitrary non-feedback bridges between two nodes, including ones detectable at higher resistance and undetectable at lower resistance, and faults requiring more than one vector for detection.

• Type: Journal
• Year: 2006
• Where: ET
• Authors: Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker
• Keywords: Arbitrary Non-feedback Bridges, ET 2006, Resistive Bridging Faults, Section-based Generation