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    BMCBI
    2007
    162views more  BMCBI 2007»
    Genome-wide identification of specific oligonucleotides using artificial neural network and computational genomic analysis
    13 years 7 months ago
    Genome-wide identification of specific oligonucleotides using artificial neural network and computational genomic analysis
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    Background: Genome-wide identification of specific oligonucleotides (oligos) is a computationallyintensive task and is a requirement for designing microarray probes, primers, and ...
    Chun-Chi Liu, Chin-Chung Lin, Ker-Chau Li, Wen-Shy...
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    BMCBI
    2008
    162views more  BMCBI 2008»
    Improved identification of conserved cassette exons using Bayesian networks
    13 years 7 months ago
    Improved identification of conserved cassette exons using Bayesian networks
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    Background: Alternative splicing is a major contributor to the diversity of eukaryotic transcriptomes and proteomes. Currently, large scale detection of alternative splicing using...
    Rileen Sinha, Michael Hiller, Rainer Pudimat, Ulri...
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    ICNC
    2005
    Springer
    110views Applied Computing» more  ICNC 2005»
    Using SOFM to Improve Web Site Text Content
    14 years 1 months ago
    Using SOFM to Improve Web Site Text Content
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    We introduce a new method to improve web site text content by identifying the most relevant free text in the web pages. In order to understand the variations in web page text, we c...
    Sebastián A. Ríos, Juan D. Vel&aacut...
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    VLSID
    1993
    IEEE
    136views VLSI» more  VLSID 1993»
    A Simulation-Based Test Generation Scheme Using Genetic Algorithms
    13 years 11 months ago
    A Simulation-Based Test Generation Scheme Using Genetic Algorithms
    Download  eprints.iisc.ernet.in
    This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
    M. Srinivas, Lalit M. Patnaik
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    CONSTRAINTS
    2007
    112views more  CONSTRAINTS 2007»
    Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
    13 years 7 months ago
    Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
    Download  www.crt.umontreal.ca
    In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
    Francisco Azevedo
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