16 search results - page 1 / 4 » Perturbation-based Fault Screening |
HPCA
2007
IEEE
14 years 5 months ago
2007
IEEE
Fault screeners are a new breed of fault identification technique that can probabilistically detect if a transient fault has affected the state of a processor. We demonstrate that...
AAAI
1994
14 years 7 days ago
1994
JCO
2008
13 years 11 months ago
2008
The identification of interaction faults in component-based systems has focussed on indicating the presence of faults, rather than their location and magnitude. While this is a va...
SAC
2008
ACM
13 years 10 months ago
2008
ACM
Despite extensive testing in the development phase, residual defects can be a great threat to dependability in the operational phase. This paper studies the utility of lowcost, ge...
ASPDAC
2006
ACM
14 years 4 months ago
2006
ACM
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...