2749 search results - page 107 / 550 » Physical Design of the |
144
click to vote
DAC
2001
ACM
16 years 6 months ago
2001
ACM
Due to larger buses (length, width) and deep sub-micron effects where coupling capacitances between bus lines are in the same order of magnitude as base capacitances, power consum...
145
click to vote
HOST
2009
IEEE
16 years 20 days ago
2009
IEEE
—Outsourcing the fabrication of semiconductor devices to merchant foundries raises some issues concerning the IP protection of the design. Active hardware metering schemes try to...
121
click to vote
ARCS
2010
Springer
15 years 10 months ago
2010
Springer
Register renaming is a widely used technique to remove false data dependencies in contemporary superscalar microprocessors. The register rename logic includes a mapping table that ...
169
click to vote
ACMDIS
2000
ACM
15 years 10 months ago
2000
ACM
This paper challenges user interface paradigms for mobile devices, by using the technical classification of augmented reality interfaces as a ‘thinking tool’ to develop ideas ...
143
click to vote
ITC
1989
IEEE
15 years 10 months ago
1989
IEEE
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...