226 search results - page 21 / 46 » Piece-Wise Model Fitting Using Local Data Patterns |
ICCV
2005
IEEE
14 years 9 months ago
2005
IEEE
We present a new approach to model visual scenes in image collections, based on local invariant features and probabilistic latent space models. Our formulation provides answers to...
VISUALIZATION
1998
IEEE
13 years 12 months ago
1998
IEEE
We introduce a new approach for mapping texture on volumetric iso-surfaces and parametric surfaces. Our approach maps 2D images on surfaces while maintaining continuity and preser...
ICCV
2001
IEEE
14 years 9 months ago
2001
IEEE
This paper presents a novel modeling algorithm that is capable of simultaneously recovering correct shape geometry as well as its unknown topology from arbitrarily complicated dat...
CVPR
2007
IEEE
14 years 9 months ago
2007
IEEE
Pattern variation is a major factor that affects the performance of recognition systems. In this paper, a novel manifold tangent modeling method called Discriminant Additive Tange...
Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...