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EMSOFT
2004
Springer
14 years 3 days ago
A metrics system for quantifying operational coupling in embedded computer control systems
One central issue in system structuring and quality prediction is the interdependencies of system modules. This paper proposes a novel technique for determining the operational co...
De-Jiu Chen, Martin Törngren
DAC
2009
ACM
14 years 7 months ago
Analysis and mitigation of process variation impacts on Power-Attack Tolerance
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
Lang Lin, Wayne P. Burleson
DAC
2007
ACM
14 years 7 months ago
Fast Second-Order Statistical Static Timing Analysis Using Parameter Dimension Reduction
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
Zhuo Feng, Peng Li, Yaping Zhan
DAC
2004
ACM
14 years 7 months ago
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Chong Zhao, Xiaoliang Bai, Sujit Dey
CODES
1996
IEEE
13 years 11 months ago
A Multi-Level Transformation Approach to HW/SW Codesign: A Case Study
This reported work applies a transformational synthesis approach to hardware/software codesign. In this approach, the process of algorithm design is coupled early on with hardware...
Tommy King-Yin Cheung, Graham R. Hellestrand, Pras...