1419 search results - page 110 / 284 » Power Droop Testing |
118
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DATE
2008
IEEE
15 years 9 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
128
Voted
IWCMC
2006
ACM
15 years 8 months ago
2006
ACM
Wireless sensors use low power radio transceivers due to the stringent constraints on battery capacity. As a result, radio transmission with wireless sensors is unreliable. Furthe...
174
Voted
ECRTS
2005
IEEE
15 years 8 months ago
2005
IEEE
Multiprocessor hardware platforms are now being considered for embedded systems, due to their high computational power and little additional cost when compared to single processor...
150
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VTS
2000
IEEE
15 years 7 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
127
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AIPR
2006
IEEE
15 years 4 months ago
2006
IEEE
The production of geospatial information from overhead imagery is generally a labor-intensive process. Analysts must accurately delineate and extract important features, such as b...