1419 search results - page 26 / 284 » Power Droop Testing |
ISCAS
2011
IEEE
13 years 1 months ago
2011
IEEE
—Linearity and spectral performance test contributes most cost of ADC test. This paper presents a new method for testing an ADC’s SNR from its linearity test data. The method d...
ICCD
2004
IEEE
14 years 6 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
ICCD
2002
IEEE
14 years 6 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
ICCAD
1992
IEEE
14 years 1 months ago
1992
IEEE
Excessive power dissipation in integrated circuits causes overheating and can lead to soft errors and or permanent damage. The severity of the problem increases in proportion to t...
FSTTCS
2009
Springer
14 years 4 months ago
2009
Springer
We study the problem of polynomial identity testing (PIT) for depth 2 arithmetic circuits over matrix algebra. We show that identity testing of depth 3 (ΣΠΣ) arithmetic circuit...