1419 search results - page 31 / 284 » Power Droop Testing |
ATS
2005
IEEE
14 years 3 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
HCI
2007
13 years 11 months ago
2007
Language effect (Chinese vs. English), and power distance between evaluator and user in usability test were investigated. 12 participants from China, Swede, and Denmark formed 7 ev...
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
ETS
2006
IEEE
14 years 3 months ago
2006
IEEE
In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
: In this research, a fixed-point multimedia co-processor is designed and tested into an ARM-10 based mobile graphics processor for portable 2-D and 3-D multimedia applications. Th...