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VTS
1999
IEEE
68views Hardware» more  VTS 1999»
14 years 2 months ago
A Test Point Insertion Algorithm for Mixed-Signal Circuits
This paper presents an algorithm based on testability measurement for test point insertion of mixed-signal circuits. Two transfer function models compatible with analog models are...
Jinyan Zhang, Sam D. Huynh, Mani Soma
DAGSTUHL
2007
13 years 11 months ago
Diagonal Circuit Identity Testing and Lower Bounds
In this paper we give the first deterministic polynomial time algorithm for testing whether a diagonal depth-3 circuit C(x1, . . . , xn) (i.e. C is a sum of powers of linear funct...
Nitin Saxena
SIBGRAPI
2006
IEEE
14 years 3 months ago
Increasing statistical power in medical image analysis
In this paper, we present a novel method for estimating the effective number of independent variables in imaging applications that require multiple hypothesis testing. The method ...
Alexei Manso Correa Machado
JSC
2006
81views more  JSC 2006»
13 years 9 months ago
Complexity bounds for zero-test algorithms
In this paper, we analyze the complexity of a zero test for expressions built from formal power series solutions of first order differential equations with non degenerate initial ...
Joris van der Hoeven, John Shackell
JCP
2007
111views more  JCP 2007»
13 years 9 months ago
Direct Method for Transient Stability Assessment of a Power System with a SSSC
—This paper proposes the energy function of a power system with a Static Synchronous Series Compensator (SSSC). They make it possible for the direct method to acquire the transie...
Prechanon Kumkratug, Panthep Laohachai