A Test Point Insertion Algorithm for Mixed-Signal Circuits

This paper presents an algorithm based on testability measurement for test point insertion of mixed-signal circuits. Two transfer function models compatible with analog models are proposed: one is for digital devices and the other is for A/D interface components. An industry power supply circuit and a common A/D converter circuit are used to validate our approaches.

• Type: Conference
• Year: 1999
• Where: VTS
• Authors: Jinyan Zhang, Sam D. Huynh, Mani Soma
• Keywords: A/D Converter Circuit, A/D Interface Components, Hardware, Transfer Function Models, VTS 1999