1419 search results - page 39 / 284 » Power Droop Testing |
PTS
2007
13 years 11 months ago
2007
Black-box testing is a popular technique for assessing the quality of a system. However, in case of a test failure, only little information is available to identify the root-cause ...
ENTCS
2007
13 years 9 months ago
2007
We develop a general testing scenario for probabilistic processes, giving rise to two theories: probabilistic may testing and probabilistic must testing. These are applied to a si...
ITC
1999
IEEE
14 years 2 months ago
1999
IEEE
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
LOPSTR
2009
Springer
14 years 2 months ago
2009
Springer
In this paper, we propose an approach for automated test case generation based on techniques from constraint programming (CP). We advocate the use of standard CP search strategies ...
EOR
2002
13 years 9 months ago
2002
This paper discusses various statistics for testing hypotheses regarding returns to scale in the context of non-parametric models of technical efficiency. In addition, the paper p...