1419 search results - page 50 / 284 » Power Droop Testing |
DFT
2004
IEEE
14 years 1 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
ICASSP
2008
IEEE
14 years 4 months ago
2008
IEEE
On open and controversial issue in empirical data analysis is to decide whether scaling and multifractal properties observed in empirical data actually exist, or whether they are ...
ICALP
2005
Springer
14 years 3 months ago
2005
Springer
We consider the problem of testing the commutativity of a black-box group specified by its k generators. The complexity (in terms of k) of this problem was first considered by Pa...
STACS
2000
Springer
14 years 1 months ago
2000
Springer
We investigate self-testing programs with relative error by allowing error terms proportional to the function to be computed. Until now, in numerical computation, error terms were ...
LISA
2008
14 years 7 days ago
2008
System administrators are unique computer users. As power users in complex and high-risk work environments, intuition tells us that they may have requirements of the tools they us...