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DAC
2007
ACM
14 years 11 months ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
MA
2010
Springer
153views Communications» more  MA 2010»
13 years 8 months ago
Testing quasi-independence for truncation data
Quasi-independence is a common assumption for analyzing truncated data. To verify this condition, we consider a class of weighted log-rank type statistics that include existing te...
Takeshi Emura, Weijing Wang
ET
2002
122views more  ET 2002»
13 years 9 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter
BMCBI
2010
84views more  BMCBI 2010»
13 years 10 months ago
Testing the additional predictive value of high-dimensional molecular data
Background: While high-dimensional molecular data such as microarray gene expression data have been used for disease outcome prediction or diagnosis purposes for about ten years i...
Anne-Laure Boulesteix, Torsten Hothorn
BMCBI
2008
179views more  BMCBI 2008»
13 years 10 months ago
Improving the power for detecting overlapping genes from multiple DNA microarray-derived gene lists
Background: In DNA microarray gene expression profiling studies, a fundamental task is to extract statistically significant genes that meet certain research hypothesis. Currently,...
Xutao Deng, Jun Xu, Charles Wang