8 search results - page 2 / 2 » Power-Aware Microarchitecture: Design and Modeling Challenge... |
ICCAD
2006
IEEE
14 years 3 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
ISCA
2007
IEEE
14 years 1 months ago
2007
IEEE
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...